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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/38527

    Title: Modeling reconstruction of coupled transmission lines using time-domain characterization in high-speed digital system
    Authors: Liu, Huang-chieh;Hsu, Show-gwo;Lee, Yu-shu;Chiu, Chien-ching
    Contributors: 淡江大學電機工程學系
    Date: 2003
    Issue Date: 2010-04-15 11:14:21 (UTC+8)
    Publisher: New York: Institute of Electrical and Electronics Engineers (IEEE)
    Abstract: A novel method is developed to reconstruct the physically structures of a nonuniform couple transmission lines from layer peeling algorithm and genetic algorithm. Base on the time domain reflection (TDR) measurement, the impedance profile of the device under test (D.U.T) is first derived by layer peeling transmission line synthesis. Then, the genetic algorithm (G.A.) is employed to extract the parameter of the lumped/distributed circuits in high-speed digital circuit. As a result, the system characteristic can be easily obtained by the extracted model and SPICE circuit simulation software.
    Relation: Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on (Volume:1 ), pp.304-307
    DOI: 10.1109/ICSMC2.2003.1428251
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Proceeding

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