English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 63183/95881 (66%)
造访人次 : 4369289      在线人数 : 181
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻

    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/38527

    题名: Modeling reconstruction of coupled transmission lines using time-domain characterization in high-speed digital system
    作者: Liu, Huang-chieh;Hsu, Show-gwo;Lee, Yu-shu;Chiu, Chien-ching
    贡献者: 淡江大學電機工程學系
    日期: 2003
    上传时间: 2010-04-15 11:14:21 (UTC+8)
    出版者: New York: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: A novel method is developed to reconstruct the physically structures of a nonuniform couple transmission lines from layer peeling algorithm and genetic algorithm. Base on the time domain reflection (TDR) measurement, the impedance profile of the device under test (D.U.T) is first derived by layer peeling transmission line synthesis. Then, the genetic algorithm (G.A.) is employed to extract the parameter of the lumped/distributed circuits in high-speed digital circuit. As a result, the system characteristic can be easily obtained by the extracted model and SPICE circuit simulation software.
    關聯: Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on (Volume:1 ), pp.304-307
    DOI: 10.1109/ICSMC2.2003.1428251
    显示于类别:[電機工程學系暨研究所] 會議論文


    档案 描述 大小格式浏览次数
    Modeling Reconstruction of Coupled Transmission.pdf319KbAdobe PDF369检视/开启



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈