English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 60868/93650 (65%)
造訪人次 : 1149674      線上人數 : 27
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/38036


    題名: The testing machine for micro-sensors subjected to different states of pressure and temperature
    作者: Yang, Lung-jieh;Wang, Hsin-hsiung;Liao, Wei-hao;Huang, Han-wei;Chang, Chih-cheng
    貢獻者: 淡江大學機械與機電工程學系
    日期: 2005-07-10
    上傳時間: 2010-04-15 10:31:46 (UTC+8)
    出版者: N.Y.: Institute of Electrical and Electronic Engineers (IEEE)
    摘要: The primary purpose of this research is to design and build up a test machine which provides a testing environment for semiconductor micro sensors made by micro-electro-mechanical systems (MEMS) technique. It combines computer auxiliary software SPARTAN into the global data-gathering system in addition to the main frame of the pressurized chamber. Different states of temperature and pressure subject to the testing of commercial pressure sensors was not only successfully achieved but the real-time sampling of the MEMS sensor output also worked well.
    關聯: Mechatronics, 2005. ICM '05. IEEE International Conference on, pp.805-810
    DOI: 10.1109/ICMECH.2005.1529365
    顯示於類別:[機械與機電工程學系暨研究所] 會議論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML365檢視/開啟
    The testing machine for micro-sensors subjected to different states of pressure and temperature.pdf635KbAdobe PDF314檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋