English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 62822/95882 (66%)
造访人次 : 4028224      在线人数 : 574
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/38036


    题名: The testing machine for micro-sensors subjected to different states of pressure and temperature
    作者: Yang, Lung-jieh;Wang, Hsin-hsiung;Liao, Wei-hao;Huang, Han-wei;Chang, Chih-cheng
    贡献者: 淡江大學機械與機電工程學系
    日期: 2005-07-10
    上传时间: 2010-04-15 10:31:46 (UTC+8)
    出版者: N.Y.: Institute of Electrical and Electronic Engineers (IEEE)
    摘要: The primary purpose of this research is to design and build up a test machine which provides a testing environment for semiconductor micro sensors made by micro-electro-mechanical systems (MEMS) technique. It combines computer auxiliary software SPARTAN into the global data-gathering system in addition to the main frame of the pressurized chamber. Different states of temperature and pressure subject to the testing of commercial pressure sensors was not only successfully achieved but the real-time sampling of the MEMS sensor output also worked well.
    關聯: Mechatronics, 2005. ICM '05. IEEE International Conference on, pp.805-810
    DOI: 10.1109/ICMECH.2005.1529365
    显示于类别:[機械與機電工程學系暨研究所] 會議論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbHTML389检视/开启
    The testing machine for micro-sensors subjected to different states of pressure and temperature.pdf635KbAdobe PDF353检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈