English  |  正體中文  |  简体中文  |  Items with full text/Total items : 55184/89457 (62%)
Visitors : 10679288      Online Users : 24
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/37553

    Title: Object-oriented programming testing methodology
    Authors: Chung, Chi-ming;Lee, Ming-chi
    Contributors: 淡江大學資訊工程學系
    Date: 1992-06-20
    Issue Date: 2010-01-11 13:42:28 (UTC+8)
    Publisher: N.Y.: IEEE (Institute of Electrical and Electronic Engineers)
    Abstract: Inheritance is an important attribute in object-oriented programming (OOP). This notion supports the class hierarchy design and captures the is-a relationship between a class and its subclass. It contributes to food properties of modularity, reusability and incremental design. However, misuse of multiple (repeated) inheritance leads to an improper class hierarchy which suffers from name-conflict and implicit errors. This type of error is very difficult to detect by conventional testing methodologies. This paper describes a graph-theoretical testing methodology for detecting this type of error. An algorithm to support this testing methodology is also presented
    Relation: Proceedings of the 4th international conference on software engineering and knowledge engineering, pp.378-385
    DOI: 10.1109/SEKE.1992.227965
    Appears in Collections:[Graduate Institute & Department of Computer Science and Information Engineering] Proceeding

    Files in This Item:

    File Description SizeFormat
    Object-oriented programming testing methodology.pdf650KbAdobe PDF439View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback