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    題名: Detection and Removal of Long Scratch Lines in Aged Films
    作者: Shih, Timothy K.;Lin, Louis H.;Lee, Won-jun
    貢獻者: 淡江大學資訊工程學系
    日期: 2006-07-09
    上傳時間: 2010-04-15 10:12:08 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: Historical films usually have defects. We study the type of defects, and propose a series of solutions to detect defects before they are repaired by our inpainting algorithms. This paper focuses on a difficult issue to locate long vertical line defects in aged films. A progressive detection algorithm is proposed. We are able to detect more than 86% (recall rate) of effective line defects. These line defects are then removed step by step. The experiments use real historical video collected from national museum and public channel, instead of using computer generated noise. The results are visually pleasant based on our subjective evaluation by volunteers
    關聯: Multimedia and Expo, 2006 IEEE International Conference on, pp.477-480
    DOI: 10.1109/ICME.2006.262576
    顯示於類別:[資訊工程學系暨研究所] 會議論文


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