English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 54488/89241 (61%)
造訪人次 : 10575404      線上人數 : 60
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/37119


    題名: Detection and Removal of Long Scratch Lines in Aged Films
    作者: Shih, Timothy K.;Lin, Louis H.;Lee, Won-jun
    貢獻者: 淡江大學資訊工程學系
    日期: 2006-07-09
    上傳時間: 2010-04-15 10:12:08 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: Historical films usually have defects. We study the type of defects, and propose a series of solutions to detect defects before they are repaired by our inpainting algorithms. This paper focuses on a difficult issue to locate long vertical line defects in aged films. A progressive detection algorithm is proposed. We are able to detect more than 86% (recall rate) of effective line defects. These line defects are then removed step by step. The experiments use real historical video collected from national museum and public channel, instead of using computer generated noise. The results are visually pleasant based on our subjective evaluation by volunteers
    關聯: Multimedia and Expo, 2006 IEEE International Conference on, pp.477-480
    DOI: 10.1109/ICME.2006.262576
    顯示於類別:[資訊工程學系暨研究所] 會議論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    1424403667_p477-480.pdf160KbAdobe PDF615檢視/開啟
    index.html0KbHTML219檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋