本論文研究利用兩條傳輸線量測FR4印刷電路板材料之介電係數與損耗常數的技巧。本論文提出一克服反推傳播常數時所面臨的多值問題的方法，可以有效解決頻率比的限制，不需將量測的頻帶切割為數等份，故可輕鬆進行超寬頻的介電係數量測，只需藉由量測兩段(含)以上的傳輸線的全雙埠S參數，即可精確反推FR4與Duroid基板材料的介電係數及損耗，且在此過程中，SMA接頭的效應可以完全的被校正移除(de-embedded)。若要能校正移除SMA接頭的效應，一般皆須使用三段(含)以上的傳輸線方可達成，至於若要完成寬頻或超寬頻的量測/校正，一般皆須使用多段(muti-line)的傳輸線。 In this paper, the author investigate the technique of using two transmission lines to measure the dielectric constant and the attenuation constant of an FR4 and Duroid substrate material. Theoretical analysis is made to tackle the multi-value problem associated with the determination of the propagation constant of the measured transmission lines. Hence, the wideband measurements of the dielectric properies can be achieved. In additions, the effect of the SMA coaxial connectors can be de-embedded such that the accuracy is assured.
