淡江大學機構典藏:Item 987654321/35611
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62822/95882 (66%)
Visitors : 4027820      Online Users : 913
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/35611


    Title: 含有限長裂紋之彈壓電複合層板動力破壞分析
    Other Titles: Dynamic fracture analysis of a finite crack between purely elastic and piezoelectric liminate
    Authors: 許吉勝;Hsu, Chi-sheng
    Contributors: 淡江大學航空太空工程學系碩士班
    應宜雄;Ing, Yi-shyong
    Keywords: 有限長裂紋;彈壓電複合層板;動力破壞;應力強度因子;finite crack;Purely Elastic and Piezoelectric laminate;dynamic fracture;stress intensity factor
    Date: 2008
    Issue Date: 2010-01-11 06:51:54 (UTC+8)
    Abstract: 本文研究主題為運用積分轉換法、奇異性積分方程與切比雪夫多項式法展開於含有限長裂紋之彈壓電複合層板動力破壞分析,文中求得此彈壓電複合層板承受反平面均佈應力與平面均佈電位移時裂紋尖端的應力強度因子和電位移強度因子,最後利用Durbin的數值拉普拉斯逆轉換法求得數值解,並與文獻上已知的結果做比較,以驗證本文結果的準確性。
    In this study, the dynamic fracture analysis of a finite crack between purely elastic and piezoelectric laminate is investigated. The purely elastic and piezoelectric laminate is subjected to uniformly anti-plane stress and in-plane electric displacement impacts. The solutions are determined by using integral transforms, singular integral equations, and Chebyshev polynomial expansions. The transient solutions for intensity factors are obtained by Durbin’s numerical inversion of Laplace transform method. The numerical results are evaluated and discussed in detail.
    Appears in Collections:[Graduate Institute & Department of Aerospace Engineering] Thesis

    Files in This Item:

    File SizeFormat
    0KbUnknown220View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback