傳統的壽命檢驗計畫，通常採用型一或型二設限方法來蒐集資料，但傳統的設限方法不允許在實驗中移除存活的實驗單位，且必須連續地監控產品，當我們因故或基於實驗上的方便無法連續檢驗產品，且在實驗中對存活的產品做移除時，就必須採用逐步區間設限方法進行實驗，本論文結合型一設限、區間設限及逐步設限方法，探討當產品壽命服從指數分配時，如何建立壽命檢驗計畫，在給定生產者風險與消費者風險下，求出壽命檢驗計畫所需的最小樣本數，以及檢定壽命的臨界值，並將以上結果編製成表，以利實務界使用。 Traditional life tests are often established based on the type I or type II censoring schemes, moreover, the survival units can not be removed during the test. In practice, we may not inspect the experiment units continuously due to some accidents or just for convenience so that some survive units needed to be removed. In the thesis, we combine type I censoring, interval censoring, and progressive censoring to develop life test plans under exponential distribution. The minimum sample sizes and the critical values of lifetime needed for life test plans are found under some removal schemes. Some tables are provided here to help the use of the proposed life test plans for practitioners.
