English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 58323/91876 (63%)
造訪人次 : 14069746      線上人數 : 91
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27926

    題名: Calibration of the operating parameters for an HB5 STEM instrument
    作者: 林震安;Lin, J. A.;Cowley, John M.
    貢獻者: 淡江大學物理學系
    日期: 1986
    上傳時間: 2009-12-31 10:52:49 (UTC+8)
    出版者: Elsevier
    摘要: The interference fringes, or electron Ronchigrams, appearing in the shadow images of thin periodic objects may be used for calibration of the operating parameters of a scanning transmission electron microscopy (STEM) instrument. The determination of the spherical aberration constant is more simple and direct than by other means used in electron or light optics. The calibrated value for the spherical aberration may then be used in the determination of other primary aberrations.
    關聯: Ultramicroscopy 19(1), pp.31-42
    DOI: 10.1016/0304-3991(86)90005-7
    顯示於類別:[物理學系暨研究所] 期刊論文


    檔案 大小格式瀏覽次數



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋