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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27926

    Title: Calibration of the operating parameters for an HB5 STEM instrument
    Authors: 林震安;Lin, J. A.;Cowley, John M.
    Contributors: 淡江大學物理學系
    Date: 1986
    Issue Date: 2009-12-31 10:52:49 (UTC+8)
    Publisher: Elsevier
    Abstract: The interference fringes, or electron Ronchigrams, appearing in the shadow images of thin periodic objects may be used for calibration of the operating parameters of a scanning transmission electron microscopy (STEM) instrument. The determination of the spherical aberration constant is more simple and direct than by other means used in electron or light optics. The calibrated value for the spherical aberration may then be used in the determination of other primary aberrations.
    Relation: Ultramicroscopy 19(1), pp.31-42
    DOI: 10.1016/0304-3991(86)90005-7
    Appears in Collections:[物理學系暨研究所] 期刊論文

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