English  |  正體中文  |  简体中文  |  Items with full text/Total items : 58237/91808 (63%)
Visitors : 13785339      Online Users : 53
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27918

    Title: Orientation of graphitic planes during annealing of "dip deposited" amorphous carbon film: A carbon K-edge X-ray absorption near-edge study
    Authors: Ray, S. C.;Pao, C. W.;Tsai, H. M.;Bose, B.;Chiou, J. W.;彭維鋒;Pong, Way-faung;Dasgupta, D.
    Contributors: 淡江大學物理學系
    Keywords: Graphitic carbon;Annealing;Raman spectroscopy
    Date: 2006-08-01
    Issue Date: 2009-12-31 10:52:26 (UTC+8)
    Publisher: Elsevier
    Abstract: Annealing effect of amorphous carbon thin films on Si(1 0 0) substrates is studied by normal incidence and angle dependent carbon K-edge X-ray absorption near-edge structure (XANES) spectroscopy. The angle dependence of the XANES signal shows that the graphitic basal planes are oriented perpendicular to the surface when the film is annealed at 1000 °C. Micro-Raman spectroscopy reveals two well-separated bands the D band at 1355 cm−1 and G band at ∼1600 cm−1, and their ID/IG intensity ratio indicates the formation of more graphitic film at higher annealing temperatures. X-ray diffraction pattern of 1000 °C temperature annealed film confirms the formation of graphite structure.
    Relation: Carbon 44(10), pp.1982-1985
    DOI: 10.1016/j.carbon.2006.01.022
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

    Files in This Item:

    File SizeFormat

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback