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    題名: Effect of the annealing temperature on the electronic and atomic structures of exchange-biased NiFe-FeMn bilayers
    作者: Lee, J. M.;Jan, J. C.;Chiou, J. W.;彭維鋒;Pong, W. F.;Tsai, M.-H.;Chang, Y. K.;Chen, Y. Y.;Wang, C. R.;Lee, J. F.;Yang, T.;Lu, Z.;Lai, W. Y.;Mai, Z. H.
    貢獻者: 淡江大學物理學系
    日期: 2002-02
    上傳時間: 2009-12-31 10:52:20 (UTC+8)
    出版者: World Scientific Publishing
    摘要: In this study we measured the Fe, Mn, and Ni L2,3-edge X-ray absorption near-edge structure (XANES) and K-edge extended X-ray absorption fine structure (EXAFS) of the ferromagnetic (FM) NiFe and antiferromagnetic (AFM) FeMn bilayer films prepared with various annealing temperatures. The branching ratios of the white-line intensities in the Fe, Mn, and Ni L2,3-edges XANES spectra and consequently the magnetic properties of these exchange-biased FM NiFe - AFM FeMn bilayers are found to depend strongly on the annealing temperature. We find that the first peak in the Fe, Mn, and Ni K-edge EXAFS Fourier transform spectra are very similar, which suggests that the nearest-neighbor bond lengths among Fe, Mn, and Ni atoms are essentially the same in the NiFe–FeMn bilayers. However, the peaks at distances greater than ~ 3 Å appear to be sensitive to the annealing temperature especially for the Fe and Mn K-edge spectra, which suggests that annealing alters the atomic structures of the next-nearest-neighbor and more distant shells surrounding the Fe and Mn atoms in the NiFe–FeMn bilayers.
    關聯: Surface Review and Letters 9(1), pp.293-298
    DOI: 10.1142/S0218625X0200221X
    顯示於類別:[物理學系暨研究所] 期刊論文


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