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    Title: Effect of swift heavy ions in Ni-Al nanocrystalline films studied by x-ray absorption spectroscopy
    Authors: Dong, C. L.;Chen, S. S.;Chiou, J. W.;Chen, Y. Y.;Guo, J. H.;Cheng, H. F.;Lin, I. N.;Chang, C. L.
    Contributors: 淡江大學物理學系
    Keywords: XANES;Intermetallic alloys;Ni-Al alloys;Swift heavy ions
    Date: 2008-07
    Issue Date: 2013-08-08 14:42:53 (UTC+8)
    Publisher: Amsterdam: Elsevier BV
    Abstract: X-ray absorption spectroscopic measurements have been used to compare the electronic structures of swift heavy ions (100 MeV Si ions) irradiated and pristine Ni-Al nanocrystalline films. Results from X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES) spectra at Al K-, and Ni L2,3-edges and extended X-ray absorption fine structure (EXAFS) at Ni K-edges are discussed. The observed XRD peaks indicate the improvement of crystalline nature and Al(1 1 1) clustering after the swift heavy ion interactions. While the XANES spectra at Ni L2,3-edges show decrease in the intensity of white line strength, the Al K-edge shows increase in intensity after irradiation. Above results imply that swift heavy ions induce low Z (i.e., Al) ion mass transport, changes in Al sp-Ni-d hybridization, and charge transfer. EXAFS results show that crystalline nature is improved after swift heavy irradiation which is consistent with XRD results.
    Relation: Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy 70(2), pp.454-457
    DOI: 10.1016/j.saa.2007.11.031
    Appears in Collections:[物理學系暨研究所] 期刊論文

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