English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 51254/86278 (59%)
造访人次 : 8001734      在线人数 : 70
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻

    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27848

    题名: Elasticity of randomly diluted central force networks under tension
    作者: Zhou, Zicong;Joós, Béla;Lai, Pik-Yin
    贡献者: 淡江大學物理學系
    关键词: Computer simulation;Elastic moduli;Entropy;Extrapolation;Least squares approximations;Particle size analysis;Percolation (solid state);Random processes;Rigidity;Stress concentration;Stress relaxation;Surface tension;Isotropic lattices;Normalization methods;Random networks;Shear relaxation;Elasticity
    日期: 2003-11-01
    上传时间: 2013-07-09 15:17:44 (UTC+8)
    出版者: College Park: American Physical Society
    摘要: We study the rigidity of two-dimensional site-diluted central force triangular networks under tension. We calculate the shear modulus μ directly and fit it with a power law of the form μ∼(p-p*)f, where p is the concentration of sites, p* its critical value, and f the critical exponent. We find that the critical behavior of μ is quite sensitive to tension. As the tension is increased there is at first a sharp drop in the values of both p* and f, followed by a slower decrease towards the values of the diluted Gaussian spring network (or random resistor network). We find that the size of the critical region is also sensitive to tension. The tension-free system has a narrower critical regime with the power law failing for p>0.8. In contrast, a small tension is sufficient to extend the power law to near p=1. The physical basis for these behaviors is discussed.
    關聯: Physical Review E (Statistical, Nonlinear, and Soft Matter Physics) 68(5), 055101(R)(5pages)
    DOI: 10.1103/PhysRevE.68.055101
    显示于类别:[物理學系暨研究所] 期刊論文


    档案 描述 大小格式浏览次数
    1539-3755_68(5)p055101(4pages).pdf58KbAdobe PDF136检视/开启



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈