English  |  正體中文  |  简体中文  |  Items with full text/Total items : 63187/95884 (66%)
Visitors : 4568949      Online Users : 266
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27739

    Title: X-ray absorption spectroscopic study on Ti/n-GaN
    Authors: Kumar, M. Senthil;Kumar, V. Sures;Asokan, K.;Chiou, J. W.;Jan, J. C.;Pong, Way-faung;Kumar, J.
    Contributors: 淡江大學物理學系
    Date: 2005-10
    Issue Date: 2013-07-09 15:11:49 (UTC+8)
    Publisher: Weinheim: Wiley - VCH Verlag GmbH & Co. KGaA
    Abstract: Formation of low resistance and thermally stable ohmic contacts to GaN is of considerable importance for device applications. Several metallization schemes for ohmic contacts to n-GaN with low contact resistance have been proposed and investigated by different techniques. We investigate 500 Å Ti/n-GaN contacts of as-deposited and rapid furnace annealed at 900 °C for 30 s, using X-ray diffraction pattern, I–V measurements, and X-ray absorption near edge spectra at Ti K- and L3,2-edges and elucidate the mechanism responsible for the high ohmic behaviour. These measurements indicate the formation of an interfacial TixN layer and intermetallic alloys of Ti and Ga at the Ti/n-GaN interface upon high temperature annealing.
    Relation: Physica Status Solidi. A: Applications and Materials Science 202(14), pp.R161-R163
    DOI: 10.1002/pssa.200521308
    Appears in Collections:[物理學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    X-ray absorption spectroscopic study on Ti n-GaN.pdf109KbAdobe PDF2View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback