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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27679


    Title: EXAFS determination of bond lengths in Zn1-xMnx Se
    Authors: 彭維鋒;Pong, Way-faung;Bunker, B. A.
    Contributors: 淡江大學物理學系
    Date: 1987-01-01
    Issue Date: 2009-12-31 10:36:42 (UTC+8)
    Publisher: Materials Research Society
    Abstract: EXAFS has been used to determine bond lengths in the diluted magnetic semiconductor Zn1−xMnxSe. These alloys change from a cubic (zincblende) crystal structure to a hexagonal (wurtzite) structure as a function of composition, with the transition at x ≈ 0.3. Although x-ray diffraction measurements show the lattice parameter to change by approximately 0.2Å through the series and the crystal structure changes from cubic to hexagonal, the nearestneighbor bond distances show no change within the experimental uncertainty of 0.0Å.
    Relation: Materials research society. Symposium. Proceedings 89, pp.231
    DOI: 10.1557/PROC-89-231
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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