淡江大學機構典藏:Item 987654321/27660
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    題名: Evanescent microwave probe study on dielectric properties of materials
    作者: Cheng, Hsiu-fung;陳宜君;Chen, Yi-chun;林諭男;Lin, I-nan
    貢獻者: 淡江大學物理學系
    關鍵詞: Dielectric properties;Impurities;Surfaces;Evanescent microwave microscopy
    日期: 2006-01-01
    上傳時間: 2009-12-31 10:34:56 (UTC+8)
    出版者: Elsevier
    摘要: A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.
    關聯: Journal of the European Ceramic Society 26(10-11), pp.1801-1805
    DOI: 10.1016/j.jeurceramsoc.2005.09.034
    顯示於類別:[物理學系暨研究所] 期刊論文

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