Evanescent microwave probe study on dielectric properties of materials

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Title:	Evanescent microwave probe study on dielectric properties of materials
Authors:	Cheng, Hsiu-fung;陳宜君;Chen, Yi-chun;林諭男;Lin, I-nan
Contributors:	淡江大學物理學系
Keywords:	Dielectric properties;Impurities;Surfaces;Evanescent microwave microscopy
Date:	2006-01-01
Issue Date:	2009-12-31 10:34:56 (UTC+8)
Publisher:	Elsevier
Abstract:	A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.
Relation:	Journal of the European Ceramic Society 26(10-11), pp.1801-1805
DOI:	10.1016/j.jeurceramsoc.2005.09.034
Appears in Collections:	[Graduate Institute & Department of Physics] Journal Article

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