English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 57524/91039 (63%)
造訪人次 : 13495064      線上人數 : 390
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27660


    題名: Evanescent microwave probe study on dielectric properties of materials
    作者: Cheng, Hsiu-fung;陳宜君;Chen, Yi-chun;林諭男;Lin, I-nan
    貢獻者: 淡江大學物理學系
    關鍵詞: Dielectric properties;Impurities;Surfaces;Evanescent microwave microscopy
    日期: 2006-01-01
    上傳時間: 2009-12-31 10:34:56 (UTC+8)
    出版者: Elsevier
    摘要: A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.
    關聯: Journal of the European Ceramic Society 26(10-11), pp.1801-1805
    DOI: 10.1016/j.jeurceramsoc.2005.09.034
    顯示於類別:[物理學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 大小格式瀏覽次數
    index.html0KbHTML5檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋