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    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27650

    題名: Microwave dielectric imaging of Ba2Ti9O20 materials with a scanning-tip microwave near-field microscope
    作者: Chen, Yi-Chun;Cheng, Hsiu-Fung;Wang, Gang;Xiang, Xiao-Dong;Chiang, Yi-Chen;Liu, Kuo Shung;林諭男;Lin, I-Nan
    貢獻者: 淡江大學物理學系
    關鍵詞: Ba2Ti9O20;Co-precipitation;Dielectric properties;Microwave ceramics;Resonators;Near field spectroscopy
    日期: 2003-12
    上傳時間: 2009-12-31 10:34:06 (UTC+8)
    出版者: Elsevier
    摘要: The dielectric image of Ba2Ti9O20, B2T9, materials at microwave frequencies was measured using a scanning evanescent microwave probe (EMP) technique. The average dielectric constant evaluated from the dielectric image (εr=26–43) was consistent with the measurements made using a conventional cavity method, which are in the range εr=32–38. The dielectric image consists of aggregates of clusters about tens of micron in size, and is totally different from the conventional granular structure for the materials, which contains submicron sized grains. The calcination conditions were observed to impose marked influence on the phase purity and hence the microwave dielectric properties of the sintered materials. EMP-derived dielectric images reveal that the materials containing secondary phases and exhibiting low Q-factor consist of aggregates of clusters with pronounced fluctuated distribution of dielectric constant, whereas the materials of high phase purity and high Q-factor show very mild fluctuation in dielectric constant over the samples.
    關聯: Journal of the European Ceramic Society 23(14), pp.2671-2675
    DOI: 10.1016/S0955-2219(03)00181-X
    顯示於類別:[物理學系暨研究所] 期刊論文


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