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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27650

    Title: Microwave dielectric imaging of Ba2Ti9O20 materials with a scanning-tip microwave near-field microscope
    Authors: Chen, Yi-Chun;Cheng, Hsiu-Fung;Wang, Gang;Xiang, Xiao-Dong;Chiang, Yi-Chen;Liu, Kuo Shung;林諭男;Lin, I-Nan
    Contributors: 淡江大學物理學系
    Keywords: Ba2Ti9O20;Co-precipitation;Dielectric properties;Microwave ceramics;Resonators;Near field spectroscopy
    Date: 2003-12
    Issue Date: 2009-12-31 10:34:06 (UTC+8)
    Publisher: Elsevier
    Abstract: The dielectric image of Ba2Ti9O20, B2T9, materials at microwave frequencies was measured using a scanning evanescent microwave probe (EMP) technique. The average dielectric constant evaluated from the dielectric image (εr=26–43) was consistent with the measurements made using a conventional cavity method, which are in the range εr=32–38. The dielectric image consists of aggregates of clusters about tens of micron in size, and is totally different from the conventional granular structure for the materials, which contains submicron sized grains. The calcination conditions were observed to impose marked influence on the phase purity and hence the microwave dielectric properties of the sintered materials. EMP-derived dielectric images reveal that the materials containing secondary phases and exhibiting low Q-factor consist of aggregates of clusters with pronounced fluctuated distribution of dielectric constant, whereas the materials of high phase purity and high Q-factor show very mild fluctuation in dielectric constant over the samples.
    Relation: Journal of the European Ceramic Society 23(14), pp.2671-2675
    DOI: 10.1016/S0955-2219(03)00181-X
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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