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    题名: Study of second-phases in Ba(Mg1/3Ta2/3)O3 materials by microwave near-field microscopy
    作者: Cheng, H. F.;Chen, Y. C.;Wang, G.;Xiang, X. D.;Chen, G. Y.;Liu, K. S.;林諭男;Lin, I. N.
    贡献者: 淡江大學物理學系
    关键词: BMT;Dielectric properties;Microwave ceramics dielectric;Resonators;Near field spectroscopy;Ba(Mg,Ta)O3
    日期: 2003-12-01
    上传时间: 2009-12-31 10:34:03 (UTC+8)
    出版者: Elsevier
    摘要: A three-dimensional (3D) finite element simulation was performed to model the behavior of the measuring resonator in an evanescent microwave probe (EMP). A calibration curve was derived using the frequency shift data as standards. The EMP measuring techniques was applied to measure the dielectric properties of Ba(Mg1/3Ta2/3)O3, BMT, materials. The average dielectric constants for these BMT materials (εr=26–30) are consistent with the dielectric properties measured by conventional cavity method. The EMP mapping indicates clearly the presence of higher or lower dielectric constant inclusions in the one-step processed BMT materials, which contain a large proportion of secondary phases. The measurements demonstrate that the EMP method is capable of mapping the distribution of dielectric constant at very high spatial resolution.
    關聯: Journal of the European Ceramic Society 23(14), pp.2667-2670
    DOI: 10.1016/S0955-2219(03)00180-8
    显示于类别:[物理學系暨研究所] 期刊論文

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