English  |  正體中文  |  简体中文  |  Items with full text/Total items : 49925/85107 (59%)
Visitors : 7781522      Online Users : 52
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27649


    Title: Study of second-phases in Ba(Mg1/3Ta2/3)O3 materials by microwave near-field microscopy
    Authors: Cheng, H. F.;Chen, Y. C.;Wang, G.;Xiang, X. D.;Chen, G. Y.;Liu, K. S.;林諭男;Lin, I. N.
    Contributors: 淡江大學物理學系
    Keywords: BMT;Dielectric properties;Microwave ceramics dielectric;Resonators;Near field spectroscopy;Ba(Mg,Ta)O3
    Date: 2003-12-01
    Issue Date: 2009-12-31 10:34:03 (UTC+8)
    Publisher: Elsevier
    Abstract: A three-dimensional (3D) finite element simulation was performed to model the behavior of the measuring resonator in an evanescent microwave probe (EMP). A calibration curve was derived using the frequency shift data as standards. The EMP measuring techniques was applied to measure the dielectric properties of Ba(Mg1/3Ta2/3)O3, BMT, materials. The average dielectric constants for these BMT materials (εr=26–30) are consistent with the dielectric properties measured by conventional cavity method. The EMP mapping indicates clearly the presence of higher or lower dielectric constant inclusions in the one-step processed BMT materials, which contain a large proportion of secondary phases. The measurements demonstrate that the EMP method is capable of mapping the distribution of dielectric constant at very high spatial resolution.
    Relation: Journal of the European Ceramic Society 23(14), pp.2667-2670
    DOI: 10.1016/S0955-2219(03)00180-8
    Appears in Collections:[物理學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    0KbUnknown203View/Open
    index.html0KbHTML53View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback