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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27649

    Title: Study of second-phases in Ba(Mg1/3Ta2/3)O3 materials by microwave near-field microscopy
    Authors: Cheng, H. F.;Chen, Y. C.;Wang, G.;Xiang, X. D.;Chen, G. Y.;Liu, K. S.;林諭男;Lin, I. N.
    Contributors: 淡江大學物理學系
    Keywords: BMT;Dielectric properties;Microwave ceramics dielectric;Resonators;Near field spectroscopy;Ba(Mg,Ta)O3
    Date: 2003-12-01
    Issue Date: 2009-12-31 10:34:03 (UTC+8)
    Publisher: Elsevier
    Abstract: A three-dimensional (3D) finite element simulation was performed to model the behavior of the measuring resonator in an evanescent microwave probe (EMP). A calibration curve was derived using the frequency shift data as standards. The EMP measuring techniques was applied to measure the dielectric properties of Ba(Mg1/3Ta2/3)O3, BMT, materials. The average dielectric constants for these BMT materials (εr=26–30) are consistent with the dielectric properties measured by conventional cavity method. The EMP mapping indicates clearly the presence of higher or lower dielectric constant inclusions in the one-step processed BMT materials, which contain a large proportion of secondary phases. The measurements demonstrate that the EMP method is capable of mapping the distribution of dielectric constant at very high spatial resolution.
    Relation: Journal of the European Ceramic Society 23(14), pp.2667-2670
    DOI: 10.1016/S0955-2219(03)00180-8
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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