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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27638

    Title: Structural transition in epitaxial Co/Cr multilayers as studied by X-ray absorption spectroscopy
    Authors: 彭維鋒;Pong, W. F.;Liou, Y. C.;Chang, K. H.;Tsai, M. H.;Hsieh, H. H.;Chang, Y. K.;鄭伯昆;Tseng, P. K.
    Contributors: 淡江大學物理學系
    Keywords: Structural transition;XANES;EXAFS
    Date: 1999-05-01
    Issue Date: 2009-12-31 10:32:11 (UTC+8)
    Publisher: Malden: Wiley-Blackwell Publishing, Inc.
    Abstract: We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co (40A)/Ct (t~) (t~ = 2, 3, 5, 7, and 9A) multilayers. The Cr K x-ray absorption near edge structure (XANES) spectra of Co/Cr multilayers indicate an abrupt transition of the Cr layer from a bcc structure to a hcp structure when the thickness of the Cr layer is decreased down to -5A or three atomic layers. The structural transition and bond-length distortion in Cr and Co layers observed in the extended x-ray absorption fine structure (EXAFS) measurements are consistent with the XANES results.
    Relation: Journal of synchrotron radiation 6(3), pp.746-748
    DOI: 10.1107/S0909049598015982
    Appears in Collections:[物理學系暨研究所] 期刊論文

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