X-ray absorption spectroscopy (XAS) study of dip deposited a-C:H(OH) thin films

doi:10.1088/0953-8984/16/32/008

淡江大學機構典藏 > 理學院 > 物理學系暨研究所 > 期刊論文 > Item 987654321/27615

請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27615

題名:	X-ray absorption spectroscopy (XAS) study of dip deposited a-C:H(OH) thin films
作者:	Ray, S.C.;Tsai, H.M.;Chiou, J.W.;Bose, B.;Jan, J.C.;Kumar, Krishna;Pong, W.F.;Dasgupta D.;Tsai, M. H.
貢獻者:	淡江大學物理學系
關鍵詞:	Absorption spectroscopy;Carbon;Decomposition;Friction;High temperature effects;Hydrogenation;X ray photoelectron spectroscopy;X ray spectroscopy;Carbon phases;X-ray absorption near-edge structures (XANES);X-ray absorption spectroscopy (XAS);Thi
日期:	2004-08
上傳時間:	2013-06-13 11:23:42 (UTC+8)
出版者:	Temple Way: Institute of Physics (IOP)
摘要:	This work measures the C and O K-edge x-ray absorption near-edge structure (XANES) spectra of hydrogenated amorphous carbon (a-C:H) films deposited at various baking temperatures Tb (Tb = 300–500 °C at 50 °C). The C–H σ* peak related to the content of the sp2 graphite-like bonding in the C K-edge spectra was found to yield to the C–H π* peak related to the sp3 diamond-like bonding at high temperature (500 °C). We find that the intensities of both the sp2 and sp3 features in the C K-edge XANES spectra decrease with increase of Tb, which suggests an increase of the defect concentration with Tb. The intensities of the O K-edge XANES spectra are found to decrease with increase of Tb, which suggests thermally induced decomposition of carbonyl contaminants on the surface. The elemental analysis C/O (or O/C) ratio was obtained from XPS spectra and indicates that films are not hydrogenated amorphous carbon but rather oxyhydrogenated amorphous carbon thin films.
關聯:	Journal of Physics Condensed Matter 16(32), pp.5713-5719
DOI:	10.1088/0953-8984/16/32/008
顯示於類別:	[物理學系暨研究所] 期刊論文

文件中的檔案:

檔案	描述	大小	格式	瀏覽次數
0953-8984_16(32)p5713-5719.pdf		273Kb	Adobe PDF	289	檢視/開啟
index.html		0Kb	HTML	93	檢視/開啟

在機構典藏中所有的資料項目都受到原著作權保護.

TAIR相關文章

資料載入中.....