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    题名: Diameter dependence of the electronic structure of ZnO nanorods determined by x-ray absorption spectroscopy and scanning photoelectron microscopy
    作者: Chiou, J. W.;Krishna Kumar, K. P.;Jan, J. C.;Tsai, H. M.;Bao, C. W.;Pong, W. F.;Chien, F. Z.;Tsai, M. H.;Hong, I. H.;Klauser, R.;Lee, J. F.;Wu, J. J.;Liu, S. C.
    贡献者: 淡江大學物理學系
    日期: 2004-10-11
    上传时间: 2009-12-31 10:29:34 (UTC+8)
    出版者: College Park: American Institute of Physics (AIP)
    摘要: O K-, Zn L3, and K-edges x-ray absorption near-edge structure (XANES) spectra and scanning photoelectron microscopy (SPEM) spectra were obtained for ZnO nanorods with various diameters. The analysis of the XANES spectra revealed increased numbers of O 2p and Zn 4p unoccupied states with the downsizing of the nanorods, which reflects the enhancement of surface states when the diameter is decreased. Valence-band photoemission spectra show a significant narrowing of the valence band for the 45 nm diameter nanorod. The Zn 3d intensities in the Zn 3d SPEM spectra are drastically diminished for all nanorods as compared to the ZnO reference film, which can be interpreted as a reduction in density of itinerant final states or in transition probability.
    關聯: Applied Physics Letters 85(15), pp.3220-3222
    DOI: 10.1063/1.1802373
    显示于类别:[物理學系暨研究所] 期刊論文


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