Electronic and bonding structures of B-C-N thin films investigated by x-ray absorption and photoemission spectroscopy

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题名:	Electronic and bonding structures of B-C-N thin films investigated by x-ray absorption and photoemission spectroscopy
作者:	Ray, S. C.;Tsai, H. M.;Bao, C. W.;Chiou, J. W.;Jan, J. C.;Krishna Kumar, K. P.;Pong, W. F.
贡献者:	淡江大學物理學系
日期:	2004-07-01
上传时间:	2009-12-31 10:21:11 (UTC+8)
出版者:	College Park: American Institute of Physics
摘要:	X-ray absorption near-edge structure (XANES) and valence-band photoelectron spectroscopy (PES) were used to investigate the electronic and bonding structures of B-C-N thin films. The intensities of the sp2-bonded features in the C K-edge XANES spectra are found to generally decrease as the C concentration increases, whereas the intensities of the sp2-bonded features in the spectra of N K-edge XANES increase with the N concentration. The decrease of the intensities of the sp2-bonded features in the C and N K-edges XANES spectra correlates with the increase of the C/B and N/B concentration ratios and the increase of Young’s modulus. Valence-band PES spectra are found to be insensitive to the variations of the B and C concentrations in B-C-N compounds.
關聯:	Journal of Applied Physics 96(1), pp.208-211
DOI:	10.1063/1.1759392
显示于类别:	[物理學系暨研究所] 期刊論文

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