Spectroscopic ellipsometry studies of YBa2Cu3O7− deposited on SrTiO3

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题名:	Spectroscopic ellipsometry studies of YBa2Cu3O7− deposited on SrTiO3
作者:	Sengupta, L. C.;Huang, D.;Roughani, B. J.;Aubel, L.;Sundaram, S.;張經霖;Chang, C. L.
贡献者:	淡江大學物理學系
日期:	1991-06-15
上传时间:	2009-12-31 10:18:47 (UTC+8)
出版者:	American Institute of Physics (AIP)
摘要:	The dielectric function E = e1 - ieZ of the YBa&u,O, _ a high-TT, superconducting fdms grown on (100) SrTiO, (c-axis oriented) and (110) SrTiO, (&oriented) substrate was measured by spectroscopic polarization modulation ellipsometry (SPME) and changes in film orientation were studied by comparing films of various thicknesses. The films deposited on SrTiO, (100) substrates demonstrated an isotropic e1 that changed with film thickness. It is observed that the decrease in the metallic dielectric behavior associated with the increase in the thickness of the films grown on (100) SrTi03 substrates is mainly due to a change in the orientation of the films. The films deposited on SrTiO, (110) showed anisotropic dielectric behavior when the plane of polarization is parallel and perpendicular to the c-axis of the film. These studies show that for this high-temperature superconductor with anisotropic dielectric. behavior, SPME is a highly sensitive technique capable of measuring small changes in the film orientation.
關聯:	Journal of Applied Physics 69(12), pp.8272-8276
DOI:	10.1063/1.347435
显示于类别:	[物理學系暨研究所] 期刊論文

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