淡江大學機構典藏:Item 987654321/27541
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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27541


    Title: Spectroscopic ellipsometry studies of YBa2Cu3O7− deposited on SrTiO3
    Authors: Sengupta, L. C.;Huang, D.;Roughani, B. J.;Aubel, L.;Sundaram, S.;張經霖;Chang, C. L.
    Contributors: 淡江大學物理學系
    Date: 1991-06-15
    Issue Date: 2009-12-31 10:18:47 (UTC+8)
    Publisher: American Institute of Physics (AIP)
    Abstract: The dielectric function E = e1 - ieZ of the YBa&u,O, _ a high-TT, superconducting fdms
    grown on (100) SrTiO, (c-axis oriented) and (110) SrTiO, (&oriented) substrate was
    measured by spectroscopic polarization modulation ellipsometry (SPME) and changes
    in film orientation were studied by comparing films of various thicknesses. The films deposited
    on SrTiO, (100) substrates demonstrated an isotropic e1 that changed with film
    thickness. It is observed that the decrease in the metallic dielectric behavior associated with
    the increase in the thickness of the films grown on (100) SrTi03 substrates is mainly
    due to a change in the orientation of the films. The films deposited on SrTiO, (110) showed
    anisotropic dielectric behavior when the plane of polarization is parallel and
    perpendicular to the c-axis of the film. These studies show that for this high-temperature
    superconductor with anisotropic dielectric. behavior, SPME is a highly sensitive technique
    capable of measuring small changes in the film orientation.
    Relation: Journal of Applied Physics 69(12), pp.8272-8276
    DOI: 10.1063/1.347435
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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