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    题名: Spectroscopic ellipsometry studies of YBa2Cu3O7− deposited on SrTiO3
    作者: Sengupta, L. C.;Huang, D.;Roughani, B. J.;Aubel, L.;Sundaram, S.;張經霖;Chang, C. L.
    贡献者: 淡江大學物理學系
    日期: 1991-06-15
    上传时间: 2009-12-31 10:18:47 (UTC+8)
    出版者: American Institute of Physics (AIP)
    摘要: The dielectric function E = e1 - ieZ of the YBa&u,O, _ a high-TT, superconducting fdms
    grown on (100) SrTiO, (c-axis oriented) and (110) SrTiO, (&oriented) substrate was
    measured by spectroscopic polarization modulation ellipsometry (SPME) and changes
    in film orientation were studied by comparing films of various thicknesses. The films deposited
    on SrTiO, (100) substrates demonstrated an isotropic e1 that changed with film
    thickness. It is observed that the decrease in the metallic dielectric behavior associated with
    the increase in the thickness of the films grown on (100) SrTi03 substrates is mainly
    due to a change in the orientation of the films. The films deposited on SrTiO, (110) showed
    anisotropic dielectric behavior when the plane of polarization is parallel and
    perpendicular to the c-axis of the film. These studies show that for this high-temperature
    superconductor with anisotropic dielectric. behavior, SPME is a highly sensitive technique
    capable of measuring small changes in the film orientation.
    關聯: Journal of Applied Physics 69(12), pp.8272-8276
    DOI: 10.1063/1.347435
    显示于类别:[物理學系暨研究所] 期刊論文


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