English  |  正體中文  |  简体中文  |  Items with full text/Total items : 51776/86996 (60%)
Visitors : 8377466      Online Users : 73
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27541


    Title: Spectroscopic ellipsometry studies of YBa2Cu3O7− deposited on SrTiO3
    Authors: Sengupta, L. C.;Huang, D.;Roughani, B. J.;Aubel, L.;Sundaram, S.;張經霖;Chang, C. L.
    Contributors: 淡江大學物理學系
    Date: 1991-06-15
    Issue Date: 2009-12-31 10:18:47 (UTC+8)
    Publisher: American Institute of Physics (AIP)
    Abstract: The dielectric function E = e1 - ieZ of the YBa&u,O, _ a high-TT, superconducting fdms
    grown on (100) SrTiO, (c-axis oriented) and (110) SrTiO, (&oriented) substrate was
    measured by spectroscopic polarization modulation ellipsometry (SPME) and changes
    in film orientation were studied by comparing films of various thicknesses. The films deposited
    on SrTiO, (100) substrates demonstrated an isotropic e1 that changed with film
    thickness. It is observed that the decrease in the metallic dielectric behavior associated with
    the increase in the thickness of the films grown on (100) SrTi03 substrates is mainly
    due to a change in the orientation of the films. The films deposited on SrTiO, (110) showed
    anisotropic dielectric behavior when the plane of polarization is parallel and
    perpendicular to the c-axis of the film. These studies show that for this high-temperature
    superconductor with anisotropic dielectric. behavior, SPME is a highly sensitive technique
    capable of measuring small changes in the film orientation.
    Relation: Journal of Applied Physics 69(12), pp.8272-8276
    DOI: 10.1063/1.347435
    Appears in Collections:[物理學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    0021-8979_69(12)p8272-8276.pdf546KbAdobe PDF626View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback