English  |  正體中文  |  简体中文  |  Items with full text/Total items : 52047/87178 (60%)
Visitors : 8690689      Online Users : 77
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27539

    Title: Correlation between electronic states of O, Cu, and Ba in several high-Tc superconductors
    Authors: Horn, S.;Cai, J.;Shaheen, S. A.;Croft, M.;張經霖;Chang, C. L.;Boer, M. L. den
    Contributors: 淡江大學物理學系
    Date: 1988-04-15
    Issue Date: 2009-12-31 10:18:18 (UTC+8)
    Publisher: College Park: American Institute of Physics (AIP)
    Abstract: X-ray photoemission measurements of Y-, Sm-, Eu-, and Yb-based high-temperature superconductors show a clear correlation between Cu 2p satellite features, which previous work has shown are associated with materials which exhibit superconductivity, and a high-binding-energy peak in the O 1s spectrum. In samples with varying oxygen content the intensity of the Cu 2p satellites changes, reflecting the Cu valence which varies between 1 + and 2 + . The high-binding-energy O peak appears to track the Cu valence. This high-binding-energy peak may be indicative of the presence of O 2p holes, suggested in some models as necessary for superconductivity. The Ba 3d peak position also changes systematically with the Cu valence.
    Relation: Journal of Applied Physics 63(8), pp.4193-4195
    DOI: 10.1063/1.341147
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

    Files in This Item:

    File Description SizeFormat
    0021-8979_63(8)p4193-4195.pdf672KbAdobe PDF300View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback