XAFS Studies of Diluted Magnetic Semiconductors Zn1-xMxS (M = Mn, Co)

機構典藏 > College of Sciences > Graduate Institute & Department of Physics > Journal Article > Item 987654321/27521

Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27521

Title:	XAFS Studies of Diluted Magnetic Semiconductors Zn1-xMxS (M = Mn, Co)
Other Titles:	稀磁性半導體Zn1-xMnxY(Y=S, Se)和Zn1-xCoxS之XAFS
Authors:	彭維鋒;Pong, Way-faung;Mayanovic, R. A.;Kao, J. K.;Hsieh, H. H.;Pieh, J. Y.;Chang, Y. K.;Kuo, K. C.;鄭伯昆;Tseng, P. K.;Lee, J. F.
Contributors:	淡江大學物理學系
Date:	1997-04-01
Issue Date:	2009-12-31 10:14:31 (UTC+8)
Publisher:	EDP Sciences
Abstract:	X-ray absorption near edges structure (XANES) spectra of the Diluted Magnetic Semiconductors (DMS) system Zn1-xMxS (M=Mn, Co) have been measured at the Mn and Co L3,2-edge using sample current mode. Analysis of the M L3,2-edge XANES spectra for Zn1-xMxS revealed the presence of a white line feature in each series, whose intensity increased linearly with concentration x. The white line feature is assigned to M 2p3/2 and 2p1/2 photoelectron excitations to nonbonding 3d(e) states and to the relatively broadened band of M 3d(t2) - S 3p hybridized antibonding states. The rate of increase of L3,2 white line intensity with x is associated with the difference in the degree of p-d hybridization of states between M 3d and S 3p.
Relation:	Journal de Physique IV 7(C2), pp.1147-1148
DOI:	10.1051/jp4:19972166
Appears in Collections:	[Graduate Institute & Department of Physics] Journal Article

Files in This Item:

File	Size	Format
index.html	0Kb	HTML	327	View/Open