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    Title: XAFS Studies of Diluted Magnetic Semiconductors Zn1-xMxS (M = Mn, Co)
    Other Titles: 稀磁性半導體Zn1-xMnxY(Y=S, Se)和Zn1-xCoxS之XAFS
    Authors: 彭維鋒;Pong, Way-faung;Mayanovic, R. A.;Kao, J. K.;Hsieh, H. H.;Pieh, J. Y.;Chang, Y. K.;Kuo, K. C.;鄭伯昆;Tseng, P. K.;Lee, J. F.
    Contributors: 淡江大學物理學系
    Date: 1997-04-01
    Issue Date: 2009-12-31 10:14:31 (UTC+8)
    Publisher: EDP Sciences
    Abstract: X-ray absorption near edges structure (XANES) spectra of the Diluted Magnetic Semiconductors (DMS) system Zn1-xMxS (M=Mn, Co) have been measured at the Mn and Co L3,2-edge using sample current mode. Analysis of the M L3,2-edge XANES spectra for Zn1-xMxS revealed the presence of a white line feature in each series, whose intensity increased linearly with concentration x. The white line feature is assigned to M 2p3/2 and 2p1/2 photoelectron excitations to nonbonding 3d(e) states and to the relatively broadened band of M 3d(t2) - S 3p hybridized antibonding states. The rate of increase of L3,2 white line intensity with x is associated with the difference in the degree of p-d hybridization of states between M 3d and S 3p.
    Relation: Journal de Physique IV 7(C2), pp.1147-1148
    DOI: 10.1051/jp4:19972166
    Appears in Collections:[物理學系暨研究所] 期刊論文

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