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    題名: Transmission electron microscopic microstructure of base-metal-electroded BaTiO3 capacitor materials with duplex structures
    作者: Chen, Cheng-sao;Chou, Chen-chia;Yang, Wei-chun;Hu, Chen-ti;林諭男;Lin, I-nan
    貢獻者: 淡江大學物理學系
    日期: 2004-01-15
    上傳時間: 2009-12-31 10:14:08 (UTC+8)
    出版者: Japan Society of Applied Physics
    摘要: Microstructures of core-shell or duplex-structured BaTiO3 materials were examined in detail by transmission electron microscopy (TEM) to correlate the microstructures of these materials with their dielectric properties. In core-shell structured materials, the grains, which contain a paraelectric shell surrounding the ferroelectric core, are frequently observed. The thickness of the shell decreased as the grains grew larger, whenever the samples were over-fired or were incorporated with SiO2 sintering aids. The variation of the core-shell microstructure of the samples with the thermal history of the materials clearly explains the extreme sensitivity of the dielectric constant-temperature (K-T) properties for these materials to processing parameters. In contrast, for duplex-structured materials, the heavily doped constituents of the samples remained as fine grains with paraelectric phase, whereas the lightly doped constituents of the materials grew, resulting in a core-shell microstructure via the incorporation of the MgO species. The K-T behavior of the duplex-structured materials is less process dependent than that of the core-shell structured ones.
    關聯: Japanese journal of applied physics 43 pt.1(1), pp.226-231
    DOI: 10.1143/JJAP.43.226
    顯示於類別:[物理學系暨研究所] 期刊論文

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