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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27497


    Title: Preparation of highly textured AlN films using Mo and Ti electrode for integrated AlN-based film bulk acoustic wave resonators
    Authors: 周正賢;Chou, Cheng-hsien;Lin, Yung-chen;Huang, Jin-hua;Tai, Nyan-hwa;林諭男;Lin, I-nan
    Contributors: 淡江大學物理學系
    Keywords: AlN;RF sputtering;buffer layer;FBAR
    Date: 2006-01-01
    Issue Date: 2009-12-31 10:12:43 (UTC+8)
    Publisher: Taylor & Francis
    Abstract: Effect of buffer layer on the characteristics of the AlN thin films deposited on SiNx/Si substrate was systematically examined. Among the buffer layers examined, both Mo and Ti buffer layers can not only greatly enhance the (002) preferred orientation of the films, but also improve the smoothness of the AlN films, whereas the Al thin films contain large grains microstructure and resulting in rough surface and wide distribution of (002) preferred orientation of the films. AlN thin films with smooth surface with (r.m.s. < 6 nm) and narrow distribution of grains' orientation (rocking curve < 3.8°), which is suitable for fabricating the devices. A thin film bulk acoustic wave resonator with resonance frequency around 1.7 GHz was fabricated from thus obtained AlN thin films.
    Relation: Integrated Ferroelectrics 80, pp.407-413
    DOI: 10.1080/10584580600663144
    Appears in Collections:[物理學系暨研究所] 期刊論文

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