Incorporation of nano-sized PZT powders (∼40 nm) into the Pb-Zr-Ti carboxylates was observed to pronouncedly enhance the kinetics of crystallization for the amorphous PZT films, which, in turn, improves the stability of the films. Lowest post-annealing temperature necessary to form the perovskite phase decreases from 600°C for powder-less PZT films to 550°C for nano-PZT incorporated films. Highest post-annealing temperature tolerable by the PZT films increases from 700°C for powder-less films to 750°C for the nano-PZT incorporated ones. The best ferroelectric properties achievable for nano-PZT incorporated films post-annealed at 750°C (1 h) are (Pr)750 = 23 μC/cm2 and (Ec)750 = 42.5 kV/cm, which are superior to those for powder-less PZT films post-annealed at 700°C for 1 h ((Pr')700 = 20.5 μC/cm2 and (Ec')700 = 36.7 kV/cm). The probable explanation for such a phenomenon is that the presence of nano-sized PZT particulates induces uniformly heterogeneous nucleation of perovskite phase over the PZT films, resulting in instantaneous formation of perovskite phase, which is less susceptible to PbO-loss phenomenon.
