TEM microstructures of X7R type base-metal-electroded BaTiO3 capacitor materials Co-doped with MgO/Y2O3 additives

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Title:	TEM microstructures of X7R type base-metal-electroded BaTiO3 capacitor materials Co-doped with MgO/Y2O3 additives
Authors:	陳正劭;Chen, Cheng-sao;Chou, Chen-chia;Yang, Wei-chun;林諭男;Lin, I-nan
Contributors:	淡江大學物理學系
Keywords:	Transmission electron microscopy;base-metal-electroded capacitor;X7R-type capacitor;core-shell microstructure
Date:	2006-01-01
Issue Date:	2009-12-31 10:11:56 (UTC+8)
Publisher:	Taylor & Francis
Abstract:	In this report, how the MgO/Y2O3 additives modify microstructure and hence the dielectric constant-temperature (K-T curve) properties of the BaTiO3 materials was examined using transmission electron microscope (TEM). TEM investigation indicates that the dielectric constant-temperature (K-T curve) properties of the materials vary with the processing parameter pronouncedly, which is presumed mainly due to the growth of the grains during sintering, altering the core-shell microstructure for the materials. Furthermore, the shell is not uniformly surrounding the core and the shell thickness varies among the grains of BaTiO3 materials. Such a phenomenon is presumed to be the prime factor resulting in the fluctuation of dielectric properties of these materials with the processing parameters.
Relation:	Ferroelectrics 332, pp.41-44
DOI:	10.1080/00150190500323529
Appears in Collections:	[Graduate Institute & Department of Physics] Journal Article

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