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    題名: TEM microstructures of X7R type base-metal-electroded BaTiO3 capacitor materials Co-doped with MgO/Y2O3 additives
    作者: 陳正劭;Chen, Cheng-sao;Chou, Chen-chia;Yang, Wei-chun;林諭男;Lin, I-nan
    貢獻者: 淡江大學物理學系
    關鍵詞: Transmission electron microscopy;base-metal-electroded capacitor;X7R-type capacitor;core-shell microstructure
    日期: 2006
    上傳時間: 2009-12-31 10:11:56 (UTC+8)
    出版者: Taylor & Francis
    摘要: In this report, how the MgO/Y2O3 additives modify microstructure and hence the dielectric constant-temperature (K-T curve) properties of the BaTiO3 materials was examined using transmission electron microscope (TEM). TEM investigation indicates that the dielectric constant-temperature (K-T curve) properties of the materials vary with the processing parameter pronouncedly, which is presumed mainly due to the growth of the grains during sintering, altering the core-shell microstructure for the materials. Furthermore, the shell is not uniformly surrounding the core and the shell thickness varies among the grains of BaTiO3 materials. Such a phenomenon is presumed to be the prime factor resulting in the fluctuation of dielectric properties of these materials with the processing parameters.
    關聯: Ferroelectrics 332, pp.41-44
    DOI: 10.1080/00150190500323529
    顯示於類別:[物理學系暨研究所] 期刊論文

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