淡江大學機構典藏:Item 987654321/27488
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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27488


    Title: Development of X7R type base-metal-electroded BaTiO3 capacitor materials by Co-doping of MgO/Y2O3 additives
    Authors: Chou, Chen-chia;陳正劭;Chen, Cheng-sao;林諭男;Lin, I-nan;Yang, Wei-chun;Cheng, Hsiu-fung
    Contributors: 淡江大學物理學系
    Keywords: Ferroelectric;barium titanate;multilayer ceramic capacitors;transmission electron microscopy
    Date: 2006-01-01
    Issue Date: 2009-12-31 10:11:52 (UTC+8)
    Publisher: Taylor & Francis
    Abstract: In this report, effect of MgO and Y2O3 additives on modifying the dielectric constant-temperature (K-T curve) properties of the BaTiO3 materials for multilayer ceramic capacitors (MLCC), using base metals (Cu and Ni) as electrode materials was systematically studied. Low temperature coefficient of capacitance (TCC), which meets X7R specification, has been obtained. Microstructural examinations using transmission electron microscopy (TEM) indicate that small TCC of thus obtained materials is attributed to microstructural control of materials. Simulation using simplified microstructure model indicates that the effective dielectric constant of core-shell structured materials significantly not only with the dielectric properties of cores and shells, but also with the shell-to-core thickness ratio, which results in a K-T behavior extremely sensitive with the processing parameters. In contrast, the X7R type K-T properties for BaTiO3 materials can be obtained in a much wider processing window by forming duplexed structure. Simulation also indicated that the effective dielectric constant of such a duplexed material is relatively insensitive to the fluctuation of K-T properties of each component.
    Relation: Ferroelectrics 332, pp.35-39
    DOI: 10.1080/00150190500323503
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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