The Electronic Properties of Nanomaterials Elucidated by Synchrotron Radiation–Based Spectroscopy

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Title:	The Electronic Properties of Nanomaterials Elucidated by Synchrotron Radiation–Based Spectroscopy
Authors:	彭維鋒;Pong, Way-faung;Ray, S. C.;Chiou, J. W.;Tsai, M. H.
Contributors:	淡江大學物理學系
Keywords:	synchrotron radiation;XAS;XANES;VB-PES;SPEM;nanomaterials
Date:	2006-01-01
Issue Date:	2009-12-31 10:09:59 (UTC+8)
Publisher:	Taylor & Francis
Abstract:	The use of synchrotron radiation–based spectroscopy to investigate electronic and bonding structures of nanostructured materials is reviewed with focuses on the X-ray absorption spectroscopy (XAS), valence-band photoemission spectroscopy (VB-PES), and scanning photoelectron microscopy (SPEM) measurements. This review addresses the current status of synchrotron radiation–based nanoscale characterization of carbon-based and ZnO nanomaterials. Current research works that are relevant to this rapidly evolving experimental area and implications in nanoscience and nanotechnology are emphasized.
Relation:	Critical Review in Solid State and Material Sciences 31(4), pp.91-110
DOI:	10.1080/10408430601044775
Appears in Collections:	[Graduate Institute & Department of Physics] Journal Article

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