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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27457


    Title: The Electronic Properties of Nanomaterials Elucidated by Synchrotron Radiation–Based Spectroscopy
    Authors: 彭維鋒;Pong, Way-faung;Ray, S. C.;Chiou, J. W.;Tsai, M. H.
    Contributors: 淡江大學物理學系
    Keywords: synchrotron radiation;XAS;XANES;VB-PES;SPEM;nanomaterials
    Date: 2006-01-01
    Issue Date: 2009-12-31 10:09:59 (UTC+8)
    Publisher: Taylor & Francis
    Abstract: The use of synchrotron radiation–based spectroscopy to investigate electronic and bonding structures of nanostructured materials is reviewed with focuses on the X-ray absorption spectroscopy (XAS), valence-band photoemission spectroscopy (VB-PES), and scanning photoelectron microscopy (SPEM) measurements. This review addresses the current status of synchrotron radiation–based nanoscale characterization of carbon-based and ZnO nanomaterials. Current research works that are relevant to this rapidly evolving experimental area and implications in nanoscience and nanotechnology are emphasized.
    Relation: Critical Review in Solid State and Material Sciences 31(4), pp.91-110
    DOI: 10.1080/10408430601044775
    Appears in Collections:[物理學系暨研究所] 期刊論文

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