A modified short-run type II continuous sampling plan

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題名:	A modified short-run type II continuous sampling plan
作者:	蔡宗儒;Tsai, Tzong-ru
貢獻者:	淡江大學統計學系
關鍵詞:	average fraction inspected;average outgoing quality;average outgoing quality limit;continuous sampling plans;generating function
日期:	2002-03
上傳時間:	2009-12-30 15:00:41 (UTC+8)
出版者:	Wiley-Blackwell
摘要:	In this article, a modified continuous sampling of type II is provided for finite production runs. The suggested sampling plan revises the continuous sampling plan-2 of Yang (1983). The proposed plan places no predetermined limit on the number of items to be inspected until the second defect is detected when in partial inspection mode. A similar derivation to that of Yang is used to find an approximation to the average outgoing quality of the modified continuous sampling plan-2 in finite production runs. Some tables are provided to aid in the selection of the clearance number and sampling fraction when the production run length and an average outgoing quality limit are given.
關聯:	Quality and Reliability Engineering International 18(2), pp.155-161
DOI:	10.1002/qre.457
顯示於類別:	[統計學系暨研究所] 期刊論文

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