淡江大學機構典藏:Item 987654321/27388
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 60882/93651 (65%)
Visitors : 1191013      Online Users : 24
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/27388


    Title: A modified short-run type II continuous sampling plan
    Authors: 蔡宗儒;Tsai, Tzong-ru
    Contributors: 淡江大學統計學系
    Keywords: average fraction inspected;average outgoing quality;average outgoing quality limit;continuous sampling plans;generating function
    Date: 2002-03
    Issue Date: 2009-12-30 15:00:41 (UTC+8)
    Publisher: Wiley-Blackwell
    Abstract: In this article, a modified continuous sampling of type II is provided for finite production runs. The suggested sampling plan revises the continuous sampling plan-2 of Yang (1983). The proposed plan places no predetermined limit on the number of items to be inspected until the second defect is detected when in partial inspection mode. A similar derivation to that of Yang is used to find an approximation to the average outgoing quality of the modified continuous sampling plan-2 in finite production runs. Some tables are provided to aid in the selection of the clearance number and sampling fraction when the production run length and an average outgoing quality limit are given.
    Relation: Quality and Reliability Engineering International 18(2), pp.155-161
    DOI: 10.1002/qre.457
    Appears in Collections:[Graduate Institute & Department of Statistics] Journal Article

    Files in This Item:

    File SizeFormat
    index.html0KbHTML161View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback