Reliability sampling plans for Weibull distribution with limited capacity of test facility

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Title:	Reliability sampling plans for Weibull distribution with limited capacity of test facility
Authors:	蔡宗儒;Tsai, Tzong-ru;呂玉婷;Lu, Yu-ting;吳碩傑;Wu,S huo-jye
Contributors:	淡江大學統計學系
Keywords:	Acceptance sampling;Posterior distribution;Prior distribution;Type II censoring;Warranty policy
Date:	2008-10
Issue Date:	2010-08-10 10:28:14 (UTC+8)
Publisher:	Elsevier
Abstract:	This paper establishes reliability sampling plans for the Weibull lifetime distribution based on type II censored data with limited capacity of test facility. The products are sold under a general rebate warranty policy. It is also assumed that the shape parameter of the lifetime distribution is known, and the scale parameter is a random variable varying from lot to lot. A cost model is established which contains the cost per unit on test, the cost per unit time for life test, and the costs of rejecting and accepting a unit. An algorithm for determining the optimal reliability sampling plans which minimize the expected average cost per lot is provided. Some numerical results to illustrate the use of the proposed method are studied.
Relation:	Computers and Industrial Engineering 55(3), pp.721-728
DOI:	10.1016/j.cie.2008.02.010
Appears in Collections:	[Graduate Institute & Department of Statistics] Journal Article

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