A postgeneration method for test time reduction of scan-designed circuits is developed. The maximum overlapping condition between consecutive applied patterns is identified. The application of the condition facilitated with the developed active sliding compatibility process significantly reduces the number of test clocks. It is demonstrated that the test clocks can be reduced by 50% on average from given test sets. Further evaluation shows that, for parity scan, the test clocks required by the authors' method are only 41% of those elsewhere.
Relation:
IEE proceedings. Computers and Digital Techniques 142(1), pp.41-48
