With today's high technology, many products last so long that life testing at usual conditions is impractical. Many products can be life tested at high stress conditions to yield failures quickly. This study presents the inferences of parameters on the stepstress model in accelerated life testing with type II censoring. A two-parameter exponential failure time distribution with a hazard function that is a log-linear function of stress and a cumulative exposure model are considered. We obtain the maximum likelihood estimators of the model parameters and construct their confidence region. A numerical example will be investigated to illustrate the proposed inferential procedure.
Journal of information & optimization sciences 23(2), pp.355-365