Piscataway: Institute of Electrical and Electronics Engineers
This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maximum likelihood method to obtain the point estimation of the parameter of failure time distribution. We provide an approach to establish reliability sampling plans which minimize the total cost of life testing under given consumer's and producer's risks. Some numerical studies are investigated to illustrate the proposed approach.
IEEE Transactions on Reliability 57(3), pp.445-451