English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62805/95882 (66%)
Visitors : 3875419      Online Users : 303
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/20659

    Title: Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions
    Authors: Huang, Syuan-Rong;Wu, Shuo-Jye
    Contributors: 淡江大學統計學系
    Keywords: Acceptance sampling;cost minimization;exponential distribution;maximum likelihood method;progressive type-I interval censoring
    Date: 2008-09-01
    Issue Date: 2009-11-30 12:55:27 (UTC+8)
    Publisher: Piscataway: Institute of Electrical and Electronics Engineers
    Abstract: This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maximum likelihood method to obtain the point estimation of the parameter of failure time distribution. We provide an approach to establish reliability sampling plans which minimize the total cost of life testing under given consumer's and producer's risks. Some numerical studies are investigated to illustrate the proposed approach.
    Relation: IEEE Transactions on Reliability 57(3), pp.445-451
    DOI: 10.1109/TR.2008.928239
    Appears in Collections:[統計學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    0018-9529_57(3)p445-451.pdf383KbAdobe PDF1630View/Open
    Reliability sampling plans under progressive type-I interval censoring using cost functions.pdf386KbAdobe PDF1View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback