淡江大學機構典藏:Item 987654321/20658
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 62797/95867 (66%)
造訪人次 : 3750565      線上人數 : 464
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/20658


    題名: Limited failure-censored life test for the Weibull distribution
    作者: Wu, Jong-wuu;Tsai, Tzong-ru;Ouyang, Liang-yuh
    貢獻者: 淡江大學統計學系
    關鍵詞: Life estimation;Life testing;Mean square error methods;Probability density function;Random variables;Sampling methods;Statistical analysis;Statistical distributions;Test facilities;Weibull distribution
    日期: 2001-03-01
    上傳時間: 2009-11-30 12:55:14 (UTC+8)
    出版者: Piscataway: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: When the distribution of lifetimes is 2-parameter exponential, Balasooriya (1995) provided a failure-censored reliability sampling plan to save test time. This paper extends the Balasooriya sampling plan to the Weibull distribution and provides a limited failure-censored reliability sampling plan (LFCR) to do life testing when test facilities are scarce. The s-expected test time of the LFCR is computed, and the optimal stopping rule of LFCR corresponding to the shortest test time is established. The s-confidence intervals for the parameters are generated
    關聯: IEEE transactions on reliability 50(1), pp.107-111
    DOI: 10.1109/24.935024
    顯示於類別:[統計學系暨研究所] 期刊論文
    [管理科學學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    0018-9529_50(1)p107-111.pdf172KbAdobe PDF1175檢視/開啟
    Limited failure-censored life test for the Weibull distribution.pdf173KbAdobe PDF3檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋