Limited failure-censored life test for the Weibull distribution

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Title:	Limited failure-censored life test for the Weibull distribution
Authors:	Wu, Jong-wuu;Tsai, Tzong-ru;Ouyang, Liang-yuh
Contributors:	淡江大學統計學系
Keywords:	Life estimation;Life testing;Mean square error methods;Probability density function;Random variables;Sampling methods;Statistical analysis;Statistical distributions;Test facilities;Weibull distribution
Date:	2001-03-01
Issue Date:	2009-11-30 12:55:14 (UTC+8)
Publisher:	Piscataway: Institute of Electrical and Electronics Engineers (IEEE)
Abstract:	When the distribution of lifetimes is 2-parameter exponential, Balasooriya (1995) provided a failure-censored reliability sampling plan to save test time. This paper extends the Balasooriya sampling plan to the Weibull distribution and provides a limited failure-censored reliability sampling plan (LFCR) to do life testing when test facilities are scarce. The s-expected test time of the LFCR is computed, and the optimal stopping rule of LFCR corresponding to the shortest test time is established. The s-confidence intervals for the parameters are generated
Relation:	IEEE transactions on reliability 50(1), pp.107-111
DOI:	10.1109/24.935024
Appears in Collections:	[Graduate Institute & Department of Statistics] Journal Article [Department of Management Sciences] Journal Article

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