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    題名: Limited failure-censored life test for the Weibull distribution
    作者: Wu, Jong-wuu;Tsai, Tzong-ru;Ouyang, Liang-yuh
    貢獻者: 淡江大學統計學系
    關鍵詞: Life estimation;Life testing;Mean square error methods;Probability density function;Random variables;Sampling methods;Statistical analysis;Statistical distributions;Test facilities;Weibull distribution
    日期: 2001-03-01
    上傳時間: 2009-11-30 12:55:14 (UTC+8)
    出版者: Piscataway: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: When the distribution of lifetimes is 2-parameter exponential, Balasooriya (1995) provided a failure-censored reliability sampling plan to save test time. This paper extends the Balasooriya sampling plan to the Weibull distribution and provides a limited failure-censored reliability sampling plan (LFCR) to do life testing when test facilities are scarce. The s-expected test time of the LFCR is computed, and the optimal stopping rule of LFCR corresponding to the shortest test time is established. The s-confidence intervals for the parameters are generated
    關聯: IEEE transactions on reliability 50(1), pp.107-111
    DOI: 10.1109/24.935024
    顯示於類別:[統計學系暨研究所] 期刊論文
    [管理科學學系暨研究所] 期刊論文

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