Planning step-stress life test with progressively type I group-censored exponential data

淡江大學機構典藏 > 商管學院 > 統計學系暨研究所 > 期刊論文 > Item 987654321/20600

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题名:	Planning step-stress life test with progressively type I group-censored exponential data
作者:	Wu, Shuo-jye;Lin, Ying-po;Chen, Yi-ju
贡献者:	淡江大學統計學系
关键词:	accelerated life test;D-optimality;grouped data;maximum likelihood method;progressive censoring;variance-optimality
日期:	2006-02-01
上传时间:	2009-11-30 12:53:19 (UTC+8)
出版者:	Wiley-Blackwell
摘要:	Accelerated life testing of products is used to get information quickly on their lifetime distributions. This paper discusses a k‐stage step‐stress accelerated life test under progressive type I censoring with grouped data. An exponential lifetime distribution with mean life that is a log‐linear function of stress is considered. A cumulative exposure model is also assumed. We use the maximum likelihood method to obtain the estimators of the model parameters. The methods for obtaining the optimum test plan are investigated using the variance‐optimality and D‐optimality criteria. Some numerical studies are discussed to illustrate the proposed criteria.
關聯:	Statistica Neerlandica 60(1), pp.46-56
DOI:	10.1111/j.1467-9574.2006.00309.x
显示于类别:	[統計學系暨研究所] 期刊論文

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