Planning step-stress life test with progressively type I group-censored exponential data

機構典藏 > College of Business and Management > Graduate Institute & Department of Statistics > Journal Article > Item 987654321/20600

Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/20600

Title:	Planning step-stress life test with progressively type I group-censored exponential data
Authors:	Wu, Shuo-jye;Lin, Ying-po;Chen, Yi-ju
Contributors:	淡江大學統計學系
Keywords:	accelerated life test;D-optimality;grouped data;maximum likelihood method;progressive censoring;variance-optimality
Date:	2006-02-01
Issue Date:	2009-11-30 12:53:19 (UTC+8)
Publisher:	Wiley-Blackwell
Abstract:	Accelerated life testing of products is used to get information quickly on their lifetime distributions. This paper discusses a k‐stage step‐stress accelerated life test under progressive type I censoring with grouped data. An exponential lifetime distribution with mean life that is a log‐linear function of stress is considered. A cumulative exposure model is also assumed. We use the maximum likelihood method to obtain the estimators of the model parameters. The methods for obtaining the optimum test plan are investigated using the variance‐optimality and D‐optimality criteria. Some numerical studies are discussed to illustrate the proposed criteria.
Relation:	Statistica Neerlandica 60(1), pp.46-56
DOI:	10.1111/j.1467-9574.2006.00309.x
Appears in Collections:	[Graduate Institute & Department of Statistics] Journal Article

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	125	View/Open
Planning step-stress life test with progressively type I group-censored exponential data.pdf		124Kb	Adobe PDF	1	View/Open