English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62805/95882 (66%)
Visitors : 3866037      Online Users : 275
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/19803

    Title: The reliability of general vague fault-tree analysis on weapon systems fault diagnosis
    Authors: Chang, J. R.;Chang, K. H.;廖述賢;Liao, Shu-hsien;Cheng, C. H.
    Contributors: 淡江大學經營決策學系
    Keywords: Vague fault tree analysis;Vague sets;Reliability analysis;Military application;Vague fault tree decision support systems (VFTDSS)
    Date: 2006-05-01
    Issue Date: 2009-11-30 12:22:45 (UTC+8)
    Publisher: Springer
    Relation: Soft Computing 10(7), pp.531-542
    DOI: 10.1007/s00500-005-0483-y
    Appears in Collections:[Department of Management Sciences] Journal Article

    Files in This Item:

    File SizeFormat

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback