Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy

doi:10.1103/PhysRevB.62.9616

淡江大學機構典藏 > 理學院 > 物理學系暨研究所 > 期刊論文 > Item 987654321/19553

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題名:	Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy
作者:	Liou, Y. H.;Pong, Way-faung;Tsai, M.-H.;Chang, K. H.;Hseih, H. H.;Chang, Y. K.;Chien, F. Z.;Tseng, P. K.;Lee, J. F.;Liou, Y.;Huang, J. C. A.
貢獻者:	淡江大學物理學系
關鍵詞:	chromium;cobalt;absorption;absorption spectroscopy;atom;chemical structure;structure analysis;thickness;X ray analysis
日期:	2000-10
上傳時間:	2013-07-09 15:14:30 (UTC+8)
出版者:	College Park: American Physical Society
摘要:	We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co(11¯00) (40 Å)/Cr(211) (tCr) (tCr=2, 3, 5, 7, and 9 Å) multilayers. The Cr K x-ray-absorption near-edge fine structure (XANES) spectra of the Co/Cr multilayers indicate an abrupt transition of the Cr layer from hcp to bcc structure when the thickness of the Cr layer is increased to exceed ∼5 Å or three atomic layers. Our results offer an upper limit for the ability of the Co/Cr interface to stabilize the hcp structure in the thin Cr layer. The numbers of nearest-neighbor and next-nearest-neighbor atoms in the Cr and Co layers determined by extended x-ray-absorption fine-structure measurements performed at the Cr and Co K edge, respectively, are consistent with the XANES results.
關聯:	Physical Review B (Condensed Matter and Materials Physics) 62(14), pp.9616-9620
DOI:	10.1103/PhysRevB.62.9616
顯示於類別:	[物理學系暨研究所] 期刊論文

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